| AFM |
Atomic Force Microscopy or Scanning Force Microscopy is a high resolution microscopy based on an interaction between a very sharp probe and a sample. Resolution is typically on the nm length scale laterally, and sub-nm length scale vertically. |
| AFM Raman |
Co-located confocal Raman microscope with an AFM tip enabling simultaneous acquisition of AFM and Raman spectroscopy images from the same location on the surface.
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| AFM Raman TERS |
Collective name for high resolution Raman measurements including Raman confocal microscope integrated with SPM microscope and metalized TERS probe. |
| Conventional TERS probes |
typically Au or Ag metalized AFM probes or STM probes. |
| Graphene TERS |
TERS has been successful in measuring the spectral characteristics of graphene with very high spatial resolution. |
| NSOM |
Near-Field Scanning Optical Microscopy: The basic principle of NSOM near-field optics: Light passes through a sub-wavelength diameter aperture and illuminates a sample that is placed within its near field, at a distance much less than the wavelength of the light. The resolution achieved is far better than that which conventional optical microscopes can attain. |
| Raman |
Raman microscopy is a form of vibrational spectroscopy for chemical characterization of materials.
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| Reflection TERS |
TERS measurements on opaque sample, when the SPM integrated with upright confocal Raman microscope. |
| SERS |
Surface enhanced Raman scattering (SERS). A well-known Raman enhancing effect where a roughened metal surface can provide orders of magnitude increase in Raman signal intensity. |
| SFM |
Scanning Force Microscopy or Atomic Force Microscopy is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
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| Side illumination TERS |
TERS measurements on opaque sample, when the SPM integrated with upright confocal Raman microscope, when the laser for Raman excitation illuminates the sample by the 45˚-60˚ relatively to the axis of the TERS probe. |
| SNOM |
Scanning Near-Field Optical Microscopy: The basic principle of SNOM near-field optics: Light passes through a sub-wavelength diameter aperture and illuminates a sample that is placed within its near field, at a distance much less than the wavelength of the light. The resolution achieved is far better than that which conventional optical microscopes can attain. |
| SPM |
Scanning Probe Microscopy is a microscopy family encompassing a very sharp probe getting close to, or in contact with, a sample. That probe is then kept close to the sample through a variety of feedback mechanisms, and various parameters of the probe-sample interaction can be measured including mechanical, optical, and electrical measurements. AFM, STM, NSOM, AFM-Raman, and TERS all belong to the scanning probe microscopy family. |
| SPP |
Surface Plasmon Polariton: infrared or visible-frequency electromagnetic waves, which travel along a metal-dielectric or metal-air interface. The term "surface plasmon polariton" explains that the wave involves both charge motion in the metal ("surface plasmon") and electromagnetic waves in the air or dielectric ("polariton") |
| Strained Silicon TERS |
TERS measurements on strained silicon substrate for TERS probes characterization in terms of the enhancement efficiency.
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| TERS |
Tip Enhanced Raman Spectroscopy is a technique that was developed to increase the lateral and axial resolution of Raman spectroscopy and thus to obtain chemical composition on the nanoscale. |
| TERS AFM |
Is the same as AFM Raman TERS |
| TERS Effect |
Enhancement of the Raman signal using the metalized AFM tip as the source for enhancement. By using such a small diameter tip, enhancement occurs only in the immediate vicinity of the tip providing a high spatial resolution for the Raman measurement. TERS provides significant improvement in resolution over conventional AFM-Raman methods. |
| TERS Microscope |
A microscope fitted with TERS equipment, including a lens (optical microscope), AFM head, TERS probes, Raman spectrometer, and CCD camera. |
| TERS Probes |
Specialized probes suitable for AFM/TERS measurements. A gold or silver ball at a variety of diameters is embedded at the end of a glass cantilevered probe to generate the enhancement of the Raman signal near the probe apex. |
| TERS Raman |
As TERS stands for “Tip-Enhanced Raman Spectroscopy”, this term is redundant on its own, but used by searchers to specify this particular meaning of the term “TERS”.- It is the same as “TERS” or “TERS effect” |
| TERS Tips |
same as TERS probes. |
| Transmission TERS |
TERS measurements on transparent or half transparent samples, when the SPM integrated with inverted confocal Raman microscope. |
